Defect structures at thin filmlsubstrate interfaces
by
P. H. Leo and Jinfu Hu
in
Journal of the Mechanics and Physics of Solids, 45, pp. 637 - 665, 1997.
Category: Journal Article
Keywords: A. interfaces, A. phase transformations, B. layered materials, C. variational calculus
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Abstract:
We consider the loss of lattice coherence at a planar interface between a thin film and substrate. Coherence is determined locally at the interface by a relative deformation gradient at the interface. We construct an interfacial free energy densityf”” such that a fully coherent interface is a global minimizer off”, and there are symmetry related local minima off”” corresponding to line defects at the interface. By considering both the interfacial energy and the elastic energy of the film, we calculate equilibrium states as a function of film thickness to predict both the loss of coherence and the geometric pattern of interfacial defects.
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